Deep-level transient spectroscopy (DLTS)
- Interfacial defects in Si1-xGex/Si quantum wells detected by deep-level transient spectroscopy
Qinhua Wang, Fang Lu, Dawei Gong, Xiangjun Chen, Jianbao Wang, Henghui Sun, and Xun Wang
Phys. Rev. B 50, 18226 (1994)