Transmission electron microscopy (TEM)
- An X-ray diffraction and electron-microscopic study of the influence of gamma radiation on multilayer AlGaAs/InGaAs/GaAs heterostructures
A. V. Bobyl, A. A. Gutkin, P. N. Brunkov, I. A. Zamoryanskaya, M. A. Yagovkina, Yu. G. Musikhin, D. A. Sakseev, S. G. Konnikov, N. A. Maleev, V. M. Ustinov, P. S. Kopjev, V. T. Punin, R. I. Ilkaev and Zh. I. Alferov
Semiconductors, 2006, Volume 40, Number 6, 06870690