NSM Archive - Silicon Germanium (SiGe) - Thermal properties

Thermal properties
Basic parameters
Remarks | Referens | |||
Bulk modulus | Si1-xGex | (97.9 - 22.8x) GPa | 300 K | Schaffler F. et al.(2001) |
Si (x=0) | 98 GPa | 300 K | see Si. Thermal properties | |
Ge(x=1) | 75 GPa | 300 K | see Ge. Thermal properties | |
Linear thermal expansion coefficien | Si1-xGex | (2.6 + 2.55x) x 10-6 K-1 | x <0.85, 300 K | Schaffler F. et al.(2001) |
Si1-xGex | (-0.89 + 7.53x) x 10-6 K-1 | x >0.85, 300 K | ||
Si (x=0) | 2.6 x 10-6 K-1 | 300 K | see Si. Thermal properties | |
Ge(x=1) | 5.9 x 10-6 K-1 | 300 K | see Ge. Thermal properties | |
Debye temperature | Si1-xGex | (640 - 266x) K | 300 K | Schaffler F. et al.(2001) |
Si (x=0) | 640 K | 300 K | see Si. Thermal properties | |
Ge(x=1) | 374 K | 300 K | see Ge. Thermal properties | |
Melting point | Si1-xGex (solidus) |
Ts![]() |
solidus, 300 K | Stohr & Klemm (1954) |
Si1-xGex (liquidus) |
Tl ![]() |
liquidus, 300 K | Stohr & Klemm (1954) | |
Si (x=0) | 1412 K | 300 K | see Si. Thermal properties | |
Ge(x=1) | 937 K | 300 K | see Ge. Thermal properties | |
Specific heat | Si1-xGex | (19.6 + 2.9x) J mol-1 K-1 | Schaffler F. et al.(2001) | |
Si (x=0) | 19.6 J mol-1 K-1 0.7 J g-1 K-1 |
300 K | ||
Ge(x=1) | 22.5 J mol-1 K-1 0.31 J g-1 K-1 |
300 K | ||
Thermal conductivity | Si1-xGex | ![]() |
0.2 < x <0.85; 300 K. see also Thermal conductivity vs. composition |
Schaffler F. et al.(2001) |
Si (x=0) | 1.3 W cm-1 K-1 | 300 K | see Si. Thermal properties | |
Ge(x=1) | 0.58 W cm-1 K-1 | 300 K | see Ge. Thermal properties | |
Thermal diffusivity | Si (x=0) | 0.8 cm2 s-1 | 300 K | see Si. Thermal properties |
Ge(x=1) | 0.36 cm2 s-1 | 300 K | see Ge. Thermal properties | |
Thermal expansion coefficient | Si1-xGex | α = (2.6 + 2.55x) x 10-6 K-1 | x < 0.85, 300 K | Zhdanova et al. (1967). |
Si1-xGex | α = (7.53 - 0.89x) x 10-6 K-1 | x > 0.85, 300 K | Zhdanova et al. (1967). |
Thermal conductivity
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Si1-xGex (undoped alloys). Thermal conductivity
vs. composition x. Stohr et al. (1954) |
K = 0.046 + 0.084x (W/cmK)
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Si1-xGex (alloys). Specific heat vs. temperature.
0.25 < x < 0.85 Inset shows the same dependences in the temperature range from 0 to 50 K. Wang & Zheng (1995). |
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Si1-xGex. Thermal expansion coefficient vs.
composition x at 300 K Zhdanova et al. (1967). |
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Si1-xGex
(alloys). Thermal expansion coefficient vs. temperature. Zhdanova et al. (1967). |
At x > 0.85 α = (7.53 - 0.89x) x 10-6 (K-1)
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Si1-xGex (binary alloys). Liquidus-solidus
curves Liquidus: Tl ![]() Solidus: Ts ![]() Stohr & Klemm (1954) |
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Si1-xGex, n-type. Seebeck coefficient
vs. electron density at different temperatures. Closed symbols -- data for the samples doped with P. Open symbols -- data for the samples doped with As. 1 -- T = 300 K. x = 0.2, 0.3, and 0.4; 2 -- T = 300 K. x = 0.8; 3 -- T = 600 K. x =0.15; 4 -- T = 900 K. x = 0.15. Dismukes et al. (1964a) |
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Si1-xGex, p-type. Seebeck coefficient
vs. electron density at different temperatures. Closed symbols -- data for the samples doped with P. Open symbols -- data for the samples doped with As. 1 -- T = 300 K. x = 0.2, 0.3, and 0.4; Two symbols below curve 1 represent the data for x == 0.7 and x = 0.8. 2 -- T = 600 K. x = 0.3; 3 -- T = 900 K. x =0.3; 4 -- T = 1200 K. x = 0.3. Dismukes et al. (1964a) |
Lattice constant
Remarks | Referens | |||
Lattice constant a(x) | Si1-xGex | a=( 5.431 + 0.20x + 0.027x2) A | 300 K | Dismukes et al. (1964b) |
see Ge. Lattice constant
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Si1-xGex. Lattice constant a vs. composition
x a(x) = 5.431 + 0.20x + 0.027x2 (A) Dismukes et al. (1964b) |